Comparing Threshold-Selection Methods for Image Segmentation: Application to Defect Detection in Automated Visual Inspection Systems.
Rafael López-LeyvaAlfonso Rojas DomínguezJuan Pablo Flores-MendozaMiguel Angel Casillas AraizaRaúl Santiago-MonteroPublished in: MCPR (2016)
Keyphrases
- defect detection
- image segmentation
- automated visual inspection
- preprocessing
- computational cost
- classification systems
- data sets
- multiscale
- threshold selection
- empirical studies
- statistical machine learning algorithms
- real time
- key technologies
- machine vision
- spectral clustering
- segmentation method
- active contours
- computer systems
- intelligent systems
- management system