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A test circuit for pin shorts generating oscillation in CMOS logic circuits.
Masahiro Ichimiya
Masaki Hashizume
Hiroyuki Yotsuyanagi
Takeomi Tamesada
Published in:
Systems and Computers in Japan (2004)
Keyphrases
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logic circuits
low power
power dissipation
high speed
power consumption
tunnel diode
low cost
gate array
logic synthesis
functional decomposition
cmos technology
circuit design
vlsi circuits
delay insensitive
analog vlsi
digital signal processing
image sensor
nm technology
efficient implementation
object oriented