Improvement of the Defect Level of Micro-computer LSI Testing.
Junichi HirasePublished in: ITC (1995)
Keyphrases
- significant improvement
- data mining
- genetic algorithm
- latent semantic indexing
- expert systems
- machine vision
- computer systems
- item response theory
- neural network
- defect detection
- levels of abstraction
- higher level
- text classification
- information retrieval systems
- image retrieval
- high level
- artificial intelligence
- learning algorithm