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Designing for reliability using a new Wafer Level Package structure.
Hendrik Pieter Hochstenbach
Willem D. van Driel
Dao-Guo Yang
Jeroen J. M. Zaal
E. Bagerman
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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structural properties
integrated circuit
structural information
data sets
information systems
multiscale
network structure
databases
real world
feature selection
hidden markov models
graphical models
tree structure
massively parallel