Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs.
Lembit JürimägiRaimund UbarMaksim JenihhinJaan RaikPublished in: Microprocess. Microsystems (2020)
Keyphrases
- digital circuits
- decision diagrams
- finite state machines
- data flow
- bayesian networks
- evolvable hardware
- heuristic search
- model based diagnosis
- probability measures
- calculation method
- evaluation measures
- probabilistic model
- generative model
- uncertain data
- conditional probabilities
- circuit design
- domain independent
- relational databases
- database