Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering.
Markus KammerstetterMarkus MuellnerDaniel BurianChristian PlatzerWolfgang KastnerPublished in: CCS (2014)
Keyphrases
- reverse engineering
- integrated circuit
- metal oxide semiconductor
- low cost
- software engineering
- semiconductor devices
- electron beam
- software maintenance
- dynamic analysis
- object oriented
- gene regulatory networks
- reverse engineer
- built in self test
- access control
- conceptual schema
- open source
- business rules
- software evolution
- legacy systems
- high density
- field effect transistors
- databases
- high speed
- information systems