Login / Signup
3D-Printed Optics for Wafer-Scale Probing.
Mareike Trappen
Matthias Blaicher
Philipp-Immanuel Dietrich
Tobias Hoose
Yilin Xu
Muhammad Rodlin Billah
Wolfgang Freude
Christian Koos
Published in:
ECOC (2018)
Keyphrases
</>
machine vision
neural network
three dimensional
scale space
decision making
integrated circuit
semiconductor manufacturing
database
real time
databases
artificial intelligence
face recognition
artificial neural networks
massively parallel