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Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform.
Kai Yang
Yanqing Zhao
Jianguo Yang
Xiaoyong Xue
Yinyin Lin
Jun-Soo Bae
Published in:
ASICON (2015)
Keyphrases
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magnetic field
high temperature
eddy current
design considerations
electromagnetic fields
real time
working principle
resonant frequency
high speed
hardware implementation
parallel architecture
hardware architecture
permanent magnet
low cost
reconfigurable hardware
silicon dioxide