TAO-BIST: A Framework for Testability Analysis and Optimizationb of RTL Circuits for BIST.

Srivaths Ravi Ganesh Lakshminarayana Niraj K. Jha

Published in: VTS (1999)

Keyphrases

statistical analysis
analysis tool
main contribution
image analysis
multiresolution
high speed
conceptual framework
built in self test
real time
image processing
multiscale
complexity analysis