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EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism.

Jakub JanickiJerzy TyszerAvijit DuttaMark KassabGrzegorz MrugalskiNilanjan MukherjeeJanusz Rajski
Published in: ITC (2011)
Keyphrases
  • channel bandwidth
  • access control
  • low power
  • multiscale
  • embedded systems
  • packet loss
  • hardware software co design
  • computational complexity
  • image quality
  • euclidean distance transform