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Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques.
Yu Wang
Xiaoming Chen
Wenping Wang
Yu Cao
Yuan Xie
Huazhong Yang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
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power consumption
cmos technology
duty cycle
power dissipation
single phase
multiple input
nm technology
power reduction
high speed
low power
power management
neural network
analog circuits
leakage current
software aging
nano scale
low voltage
power saving
age estimation