Built-In Test for CMOS Circuits.

Corot W. Starke

Published in: ITC (1984)

Keyphrases

high speed
analog vlsi
delay insensitive
circuit design
vlsi circuits
low cost
test data
cmos technology
power consumption
low voltage
databases
image sequences
test cases
real time
computer vision
power supply
digital circuits
social networks
artificial intelligence
genetic algorithm