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Non-raster sampling in atomic force microscopy: A compressed sensing approach.
Sean B. Andersson
Lucy Y. Pao
Published in:
ACC (2012)
Keyphrases
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compressed sensing
compressive sampling
atomic force microscopy
image reconstruction
orthogonal matching pursuit
random projections
compressive sensing
natural images
signal processing
sparse representation
random sampling
pattern recognition
sample size
machine learning
fourier domain