Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs.
Mukesh AgrawalKrishnendu ChakrabartyRandy WidialaksonoPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
- optimization algorithm
- optimization process
- real time
- optimization method
- optimization problems
- global optimization
- test cases
- test data
- discrete optimization
- optimization methods
- learning algorithm
- information retrieval
- learning objects
- combinatorial optimization
- bayesian networks
- decision trees
- constrained optimization
- multiple objectives