Fine-grain Sleep Transistor Placement Considering Leakage Feedback Gate.

Yu Wang Hui Wang Huazhong Yang

Published in: APCCAS (2006)

Keyphrases

fine grain
leakage current
coarse grain
low voltage
silicon dioxide
parallel computation
high speed
electrical properties
integrated circuit
distributed memory
nested transactions
general purpose
fine grained
parallel processing
parallel computing
field effect transistors