Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis.

N. Pete Sedcole Peter Y. K. Cheung

Published in: FPGA (2007)

Keyphrases

quantitative analysis
qualitative analysis
qualitative evaluation
qualitative and quantitative analysis
parametric models
neural network
high quality
low cost
field programmable gate array
cell segmentation
data sets
embedded systems
hardware implementation