Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles.
Abhilash GoyalMadhavan SwaminathanAbhijit ChatterjeePublished in: J. Electron. Test. (2010)
Keyphrases
- low cost
- low power
- asynchronous circuits
- test case generation
- formal verification
- high level
- high power
- logic circuits
- relevance feedback
- digital camera
- hardware and software
- high speed
- information retrieval
- test suite
- neural network
- single chip
- information systems
- data acquisition
- tunnel diode
- code generation
- digital circuits
- radio frequency
- specification language
- dynamic range