BIST approach for testing configurable logic and memory resources in FPGAs.
Zhiquan ZhangZhiping WenLei ChenTao ZhouFan ZhangPublished in: APCCAS (2008)
Keyphrases
- resource management
- built in self test
- resource consumption
- limited resources
- random access memory
- logic programming
- computing resources
- memory usage
- modal logic
- memory requirements
- resource constraints
- resource allocation
- automated reasoning
- multi valued
- memory space
- test cases
- computing environments
- proof theory
- memory size
- learning resources
- limited memory
- logical framework
- main memory
- software testing
- web resources