On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuits.
Yu ZhengKenneth L. ShepardPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2003)
Keyphrases
- integrated circuit
- metal oxide semiconductor
- printed circuit boards
- circuit design
- built in self test
- frequency domain
- high speed
- low cost
- digital content
- high density
- vlsi implementation
- electron beam
- cmos image sensor
- physical design
- chip design
- hardware description language
- host computer
- sigma delta
- mixed signal
- digital media
- phase locked loop