Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model.
Shah M. JahinuzzamanMohammad SharifkhaniManoj SachdevPublished in: ISQED (2008)
Keyphrases
- process model
- management system
- probabilistic model
- conceptual model
- high level
- probability distribution
- computational model
- neural network
- expert systems
- prior knowledge
- formal model
- analytical model
- least squares
- development process
- sensitivity analysis
- statistical model
- metamodel
- binary codes
- database
- experimental data
- parameter estimation
- theoretical analysis
- cost function
- case study
- decision trees
- social networks