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Studying the Viability of Static Complementary Metal-Oxide-Semiconductor Gates with a Large Number of Inputs When Using Separate Transistor Wells.

David Guerrero MartosAlejandro MillánJorge JuanManuel J. BellidoPaulino Ruiz-de-ClavijoEnrique OstúaJulian Viejo
Published in: J. Low Power Electron. (2011)
Keyphrases
  • metal oxide semiconductor
  • low cost
  • image analysis
  • high speed
  • image restoration