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Noise-Robust Online Measurement of the On-State Resistance of the Power Semiconductor Devices in PWM Converters.

Junho ShinJong-Won ShinWonhee Kim
Published in: IEEE Access (2024)
Keyphrases
  • image noise
  • semiconductor devices
  • online learning
  • real time
  • search algorithm
  • measurement error
  • duty cycle
  • cloud computing
  • missing data
  • noisy data
  • estimation error
  • electron beam
  • weak signal detection