Heuristic Approach for Identification of Random TSV Defects in 3D IC During Pre-bond Testing.

Tanusree Kaibartta G. P. Biswas Debesh K. Das

Published in: ATS (2020)

Keyphrases

test set
optimal solution
test cases
integrated circuit
dynamic programming
tabu search
randomly generated
test data
heuristic solution
software development life cycle
database
data sets
information retrieval
upper bound
search procedure
depth first search