On-chip calibration technique for delay line based BIST jitter measurement.

Bryan Nelson Mani Soma

Published in: ISCAS (1) (2004)

Keyphrases

built in self test
low cost
high speed
camera calibration
data acquisition
high density
physical design
analog vlsi
hand eye coordination
focal length
measurement error
programmable logic
design methodology
intrinsic parameters
circuit design
vlsi implementation