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Wrapper design for embedded core test.

Yervant ZorianErik Jan MarinissenMaurice LousbergSandeep Kumar Goel
Published in: ITC (2000)
Keyphrases
  • user interface
  • embedded systems
  • optimal design
  • feature selection
  • design process
  • test data
  • design decisions
  • design tools
  • machine learning
  • information retrieval
  • multiscale
  • support vector machine