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Capacitance and Yield Evaluations Using a 90-nm Process Technology Based on the Dense Power-Ground Interconnect Architecture.

Atsushi KurokawaMasaharu YamamotoNobuto OnoTetsuro KageYasuaki InoueHiroo Masuda
Published in: ISQED (2005)
Keyphrases
  • high speed
  • power consumption
  • power dissipation
  • nm technology
  • process management
  • real time
  • rapid development
  • key technologies
  • cmos technology
  • control system
  • low cost
  • data processing
  • cost effective