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Capacitance and Yield Evaluations Using a 90-nm Process Technology Based on the Dense Power-Ground Interconnect Architecture.
Atsushi Kurokawa
Masaharu Yamamoto
Nobuto Ono
Tetsuro Kage
Yasuaki Inoue
Hiroo Masuda
Published in:
ISQED (2005)
Keyphrases
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high speed
power consumption
power dissipation
nm technology
process management
real time
rapid development
key technologies
cmos technology
control system
low cost
data processing
cost effective