C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations.
Wei ZengHengliang ZhuXuan ZengDian ZhouRuey-Wen LiuXin LiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)