Adaptive ECC for Tailored Protection of Nanoscale Memory.

Dongyeob Shin Jongsun Park Jangwon Park Somnath Paul Swarup Bhunia

Published in: IEEE Des. Test (2017)

Keyphrases

memory usage
main memory
error correction
error correcting
data sets
learning algorithm
search engine
decision trees
digital images
data management
personal information
privacy protection
adaptive systems
memory size
atomic force microscopy