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Adaptive ECC for Tailored Protection of Nanoscale Memory.
Dongyeob Shin
Jongsun Park
Jangwon Park
Somnath Paul
Swarup Bhunia
Published in:
IEEE Des. Test (2017)
Keyphrases
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memory usage
main memory
error correction
error correcting
data sets
learning algorithm
search engine
decision trees
digital images
data management
personal information
privacy protection
adaptive systems
memory size
atomic force microscopy