Login / Signup
From an analytic NBTI device model to reliability assessment of complex digital circuits.
Nasim Pour Aryan
A. Listl
Leonhard Heiß
Cenk Yilmaz
Georg Georgakos
Doris Schmitt-Landsiedel
Published in:
IOLTS (2014)
Keyphrases
</>
computational model
mathematical model
probabilistic model
experimental data
high level
reinforcement learning
management system
statistical model
real world
machine learning
formal model
prediction model
model based diagnosis
digital circuits