Neural Networks-Based Parametric Testing of Analog IC.
Viera StopjakováDaniel MicusíkLubica BenuskováMartin MargalaPublished in: DFT (2002)
Keyphrases
- neural network
- pattern recognition
- genetic algorithm
- artificial neural networks
- integrated circuit
- feed forward
- network architecture
- neural nets
- artificial intelligence
- activation function
- analog vlsi
- analog circuits
- fuzzy systems
- multi layer
- associative memory
- recurrent neural networks
- test data
- signal processing
- image processing
- search engine