On-chip timing uncertainty measurements on IBM microprocessors.
Robert L. FranchPhillip J. RestleJames K. NormanWilliam V. HuottJoshua FriedrichR. DixonSteve WeitzelK. van GoorG. SalemPublished in: ITC (2007)
Keyphrases
- single chip
- measurement noise
- measurement errors
- low cost
- high speed
- measurement error
- ibm zenterprise
- decision theory
- computer architecture
- uncertain data
- analog vlsi
- neural network
- robust optimization
- probability theory
- measured data
- measurement data
- vlsi implementation
- asynchronous circuits
- high density
- industry standard
- level parallelism
- input output
- physical design
- leading edge
- inherent uncertainty
- low power
- conditional probabilities