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Probabilistic transfer matrices in symbolic reliability analysis of logic circuits.
Smita Krishnaswamy
George F. Viamontes
Igor L. Markov
John P. Hayes
Published in:
ACM Trans. Design Autom. Electr. Syst. (2008)
Keyphrases
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reliability analysis
logic circuits
low power
tunnel diode
logic synthesis
functional decomposition
gate array
text mining
low cost
real time
neural network
data mining
artificial neural networks
condition monitoring