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Impact and Design Guideline of Monolithic 3-D IC at the 7-nm Technology Node.

Kyungwook ChangKartik AcharyaSaurabh SinhaBrian ClineGreg YericSung Kyu Lim
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
  • design process
  • nm technology
  • neural network
  • case study
  • engineering design
  • pattern recognition
  • power consumption
  • directed graph