Ultra low-cost defect protection for microprocessor pipelines.
Smitha ShyamKypros ConstantinidesSujay PhadkeValeria BertaccoTodd M. AustinPublished in: ASPLOS (2006)
Keyphrases
- low cost
- high speed
- low power
- cost effective
- hardware and software
- design methodology
- real time
- data acquisition
- digital camera
- special purpose hardware
- information security
- data protection
- reed solomon codes
- functional verification
- protection scheme
- physical design
- single chip
- highly efficient
- data mining
- defect detection
- instruction set
- rfid tags
- ibm zenterprise
- memory subsystem
- learning algorithm