On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory.

Sheetal Barekar Madan Mali

Published in: LASCAS (2021)

Keyphrases

defect detection
memory subsystem
main memory
multithreading
high density
memory access
feature extraction
query processing
low cost
high speed
index structure
machine vision
resource consumption
circuit design
memory hierarchy
cache misses