Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.

Jonathan R. Carter Sule Ozev Daniel J. Sorin

Published in: DATE (2005)

Keyphrases

leakage current
low voltage
field effect transistors
high speed
modeling method
concurrent programs
neural network
multiple input
short circuit
decision making
test set
steady state
high density
fuel cell