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Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.

Jonathan R. CarterSule OzevDaniel J. Sorin
Published in: DATE (2005)
Keyphrases
  • leakage current
  • low voltage
  • field effect transistors
  • high speed
  • modeling method
  • concurrent programs
  • neural network
  • multiple input
  • short circuit
  • decision making
  • test set
  • steady state
  • high density
  • fuel cell