Temperature Aware Adaptations for Improved Read Reliability in STT-MRAM Memory Subsystem.
Saravanan SethuramanVenkata Kalyan TavvaKarthick RajamaniChitra K. SubramanianKyu-hyoun KimHillery C. HunterM. B. SrinivasPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)