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A SAR ADC BIST for simplified linearity test.

An-Sheng ChaoSoon-Jyh ChangHsin-Wen Ting
Published in: SoCC (2011)
Keyphrases
  • data sets
  • test data
  • built in self test
  • image reconstruction
  • synthetic aperture radar
  • database
  • automatic target recognition
  • multiscale
  • markov random field
  • synthetic aperture radar images