Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors.
J. LefevreP. DebaudP. GirardArnaud VirazelPublished in: ITC (2023)
Keyphrases
- image sensor
- video camera
- dynamic range
- digital camera
- low power
- image processing algorithms
- imaging systems
- solid state
- hardware and software
- single chip
- cmos image sensor
- power consumption
- low cost
- motion blur
- high speed
- charge coupled device
- high quality
- built in self test
- cmos technology
- computer systems
- spatio temporal