Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies.
Mustafa BadarogluStéphane DonnayHugo J. De ManYann A. ZinziusGeorges G. E. GielenWilly SansenTony FondenSvante SignellPublished in: IEEE J. Solid State Circuits (2003)