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Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control.
Shi-Yu Huang
Yu-Hsiang Lin
Li-Ren Huang
Kun-Han Tsai
Wu-Tung Cheng
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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