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A droop measurement built-in self-test circuit for digital low-dropout regulators.

Aydin DiricanCagatay OzmenMartin Margala
Published in: ISQED (2018)
Keyphrases
  • circuit design
  • built in self test
  • high speed
  • digital media
  • digital circuits
  • neural network
  • artificial intelligence
  • expert systems
  • highly correlated
  • high levels
  • measurement error
  • phase locked loop