Sign in

Characterization of Interconnect Fault Effects in SRAM-based FPGAs.

Christian FibichMartin HorauerRoman Obermaisser
Published in: DDECS (2023)
Keyphrases
  • fault diagnosis
  • failure modes
  • high speed
  • power consumption
  • real time
  • information systems
  • fault detection
  • learning algorithm
  • case study
  • embedded systems
  • parallel architectures