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Hot-Electron Effects in GaN GITs and HD-GITs: A Comprehensive Analysis.
Eric E. Fabris
Matteo Meneghini
Carlo De Santi
Matteo Borga
Gaudenzio Meneghesso
Enrico Zanoni
Y. Kinoshita
K. Tanaka
H. Ishida
Tetsuzo Ueda
Published in:
IRPS (2019)
Keyphrases
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comprehensive analysis
structuring elements
high definition
computer based instruction
high energy
database
data sets
databases
data mining
information systems
feature selection
image sequences
negative effects
metal oxide