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Dynamic state traversal for sequential circuit test generation.
Michael S. Hsiao
Elizabeth M. Rudnick
Janak H. Patel
Published in:
ACM Trans. Design Autom. Electr. Syst. (2000)
Keyphrases
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test generation
image processing
artificial intelligence
high speed
test cases
test sequences
data sets
machine learning
information systems
complex systems
quality assessment
quality assurance