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Dynamic state traversal for sequential circuit test generation.

Michael S. HsiaoElizabeth M. RudnickJanak H. Patel
Published in: ACM Trans. Design Autom. Electr. Syst. (2000)
Keyphrases
  • test generation
  • image processing
  • artificial intelligence
  • high speed
  • test cases
  • test sequences
  • data sets
  • machine learning
  • information systems
  • complex systems
  • quality assessment
  • quality assurance