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Refractive index characterization of waveguide channels using spectroscopic ellipsometry.
Vasco R. Fernandes
Carlos M. S. Vicente
Edison Pecoraro
Naoya Wada
Paulo S. André
Rute A. S. Ferreira
Published in:
EUROCON (2011)
Keyphrases
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refractive index
waveguide
photometric stereo
single view
surface normals
intensity images
zenith angle
feature vectors
multi view