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InxGa1-xSb MOSFET: Performance analysis by self consistent CV characterization and direct tunneling gate leakage current.

Md. Hasibul AlamIftikhar Ahmad NiazImtiaz AhmedZubair Al AzimNadim ChowdhuryQuazi Deen Mohd Khosru
Published in: EIT (2012)
Keyphrases
  • leakage current
  • low voltage
  • silicon dioxide
  • electrical properties
  • power line
  • video sequences