Printed Circuit Board Defect Detection Using Deep Learning via A Skip-Connected Convolutional Autoencoder.
Jungsuk KimJungbeom KoHojong ChoiHyunchul KimPublished in: Sensors (2021)
Keyphrases
- deep learning
- defect detection
- printed circuit boards
- restricted boltzmann machine
- unsupervised learning
- deep belief networks
- unsupervised feature learning
- integrated circuit
- visual inspection
- automated visual inspection
- feature extraction
- machine learning
- mental models
- pattern recognition
- multiscale
- learning algorithm
- weakly supervised
- principal component analysis
- object recognition