Login / Signup
A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits.
Toshinori Hosokawa
Hiroshi Date
Michiaki Muraoka
Published in:
VTS (2002)
Keyphrases
</>
generation method
database
experimental data
data processing
prior knowledge
data sets
test data
data collection
data analysis
data mining
neural network
knowledge discovery
small number
metadata
learning algorithm
computer systems
synthetic data
test cases
genetic algorithm
raw data