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Characterization and Modeling of BTI in SiC MOSFETs.

Davide CornigliAndrea Natale TallaricoSusanna ReggianiClaudio FiegnaEnrico SangiorgiLuis SanchezCarlos ValdiviesoGiuseppe ConsentinoFelice Crupi
Published in: ESSDERC (2019)
Keyphrases
  • three dimensional
  • image analysis
  • data sets
  • databases
  • search engine
  • computer vision
  • database systems
  • cooperative
  • data analysis
  • pairwise
  • modeling method